{"doi":"10.3390/cryst11121465","title":"Probing Surface Information of Alloy by Time of Flight-Secondary Ion Mass Spectrometer","abstract":"<jats:p>In recent years, time of flight-secondary ion mass spectrometer (ToF-SIMS) has been widely employed to acquire surface information of materials. Here, we investigated the alloy surface by combining the mass spectra and 2D mapping images of ToF-SIMS. We found by surprise that these two results seem to be inconsistent with each other. Therefore, other surface characteristic tools such as SEM-EDS were further used to provide additional supports. The results indicated that such differences may originate from the variance of secondary ion yields, which might be affected by crystal orientation.</jats:p>","journal":"Crystals","year":2021,"id":679037,"datarank":0.40620753016533157,"base_score":2.70805020110221,"endowment":2.70805020110221,"self_citation_contribution":0.40620753016533157,"citation_network_contribution":0.0,"self_endowment_contribution":0.40620753016533157,"citer_contribution":0.0,"corpus_percentile":null,"corpus_rank":null,"citation_count":14,"citer_count":0,"citers_with_citation_signal":0,"citers_with_endowment":0,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_data_producer":false,"deposit_databanks":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"fair_score":null,"fair_percentile":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":1774179,"name":"Meishuai Zou","orcid":"0000-0002-3608-4088","position":1,"is_corresponding":false},{"id":1774181,"name":"Defeng Lu","orcid":null,"position":2,"is_corresponding":false},{"id":1774183,"name":"Hanyuan Chen","orcid":null,"position":3,"is_corresponding":false},{"id":1774185,"name":"Benpeng Wang","orcid":null,"position":4,"is_corresponding":false},{"id":970398,"name":"Shuo Wang","orcid":"0000-0002-3146-5818","position":5,"is_corresponding":false},{"id":555479,"name":"Fan Xu","orcid":"0000-0003-0833-1982","position":6,"is_corresponding":false},{"id":1774177,"name":"Tinglu Song","orcid":"0000-0003-3907-7956","position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"resolved":true,"title":"Probing Surface Information of Alloy by Time of Flight-Secondary Ion Mass Spectrometer","abstract":"<jats:p>In recent years, time of flight-secondary ion mass spectrometer (ToF-SIMS) has been widely employed to acquire surface information of materials. Here, we investigated the alloy surface by combining the mass spectra and 2D mapping images of ToF-SIMS. We found by surprise that these two results seem to be inconsistent with each other. Therefore, other surface characteristic tools such as SEM-EDS were further used to provide additional supports. The results indicated that such differences may originate from the variance of secondary ion yields, which might be affected by crystal orientation.</jats:p>","is_dataset_classified":null,"base_score":2.70805020110221,"endowment":2.70805020110221,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"21097893","pmcid":null,"openalex_id":"https://openalex.org/W3215219305","authors":[],"funders":[{"funder_name":"Postdoctoral Research Foundation of China","grant_id":"2019M660483","title":null}],"total_grants":1,"fwci":1.3685,"citation_percentile":0.77490265,"influential_citations":0,"citation_trend":[{"year":2022,"count":3},{"year":2023,"count":5},{"year":2024,"count":1},{"year":2025,"count":4},{"year":2026,"count":1}],"oa_status":"gold","license":"cc-by","oa_locations":[{"url":"https://www.mdpi.com/2073-4352/11/12/1465/pdf?version=1637918796","host_type":"journal"},{"url":"https://www.mdpi.com/2073-4352/11/12/1465/pdf?version=1637918796","host_type":"publisher"},{"url":"https://www.mdpi.com/2073-4352/11/12/1465/pdf","host_type":"publisher"},{"url":"https://doi.org/10.3390/cryst11121465","host_type":"journal"},{"url":"https://doaj.org/article/fed13e9c23c04c7a97fbb7840754f40f","host_type":"repository"},{"url":"https://dx.doi.org/10.3390/cryst11121465","host_type":"repository"}],"fields_of_study":["Ion-surface interactions and analysis","Integrated Circuits and Semiconductor Failure Analysis","Force Microscopy Techniques and Applications"],"mesh_terms":[],"keywords":["Secondary ion mass spectrometry","Time of flight","Ion","Mass spectrometry","Mass spectrum","Alloy","Materials science","Surprise","Analytical Chemistry (journal)","Chemistry","Optics","Physics","Metallurgy","Chromatography"],"sdg_mappings":[],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-08-17T12:04:37.781914Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"fair_f":null,"fair_a":null,"fair_i":null,"fair_r":null,"fair_zscore":null,"fair_rationale":null,"fair_model":null,"fair_agent_version":null,"fair_fulltext_source":null,"fair_has_llm":null,"fair_computed_at":null,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}