{"doi":"10.2172/15004113","title":"EE FY00 report: nanostructure multilayer materials for capacitors","abstract":null,"journal":null,"year":2000,"id":688444,"datarank":0.0,"base_score":0.0,"endowment":0.0,"self_citation_contribution":0.0,"citation_network_contribution":0.0,"self_endowment_contribution":0.0,"citer_contribution":0.0,"corpus_percentile":null,"corpus_rank":null,"citation_count":0,"citer_count":0,"citers_with_citation_signal":0,"citers_with_endowment":0,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_data_producer":false,"deposit_databanks":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"fair_score":null,"fair_percentile":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":1798519,"name":"T W Jr Barbee","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"resolved":true,"title":"EE FY00 report: nanostructure multilayer materials for capacitors","abstract":"Only two intrinsic approaches to increasing the density of energy stored in capacitors are known: (1) Increase the Dielectric Constant while maintaining the breakdown filed; and (2) Increase the breakdown field for a given dielectric constant material. The maximum energy density, E{sub 0} (Joules/cm{sup 3}) that can be stored in the dielectric of a capacitor is given by: E{sub 0} = 1/2 k {var_epsilon}{sub 0} V{sub b}{sup 2} (Joules/cm{sup 3} dielectric). Where k is the relative permittivity (dielectric constant), {var_epsilon}{sub 0} is the permittivity of free space (8.894 x 10{sup -14} F/cm) and V{sub b} the dielectric material breakdown field. In this project we have successfully developed capacitor structures using dielectric materials with 3 < k < 50 that exhibit high breakdown fields. The observed performance of these capacitors as characterized by the energy stored per unit volume of dielectric at V{sub b} are compared on the basis of the breakdown field in Figure 1.","is_dataset_classified":null,"base_score":0.0,"endowment":0.0,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"21097893","pmcid":null,"openalex_id":"https://openalex.org/W205778126","authors":[],"funders":[],"total_grants":0,"fwci":null,"citation_percentile":null,"influential_citations":0,"citation_trend":[],"oa_status":"green","license":null,"oa_locations":[{"url":"https://www.osti.gov/biblio/15004113","host_type":"repository"},{"url":"https://www.osti.gov/biblio/15004113","host_type":"repository"},{"url":"https://doi.org/10.2172/15004113","host_type":""},{"url":"https://digital.library.unt.edu/ark:/67531/metadc1406035/","host_type":"repository"}],"fields_of_study":["Dielectric materials and actuators","Advanced Sensor and Energy Harvesting Materials","Electrowetting and Microfluidic Technologies"],"mesh_terms":[],"keywords":["Capacitor","Dielectric","Permittivity","Materials science","Relative permittivity","High-κ dielectric","Film capacitor","Dielectric loss","Analytical Chemistry (journal)","Electrical engineering","Condensed matter physics","Optoelectronics","Physics","Chemistry","Voltage"],"sdg_mappings":[{"sdg_number":0,"sdg_label":"Affordable and clean energy"}],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-08-19T16:14:15.414399Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"fair_f":null,"fair_a":null,"fair_i":null,"fair_r":null,"fair_zscore":null,"fair_rationale":null,"fair_model":null,"fair_agent_version":null,"fair_fulltext_source":null,"fair_has_llm":null,"fair_computed_at":null,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}