{"doi":"10.1154/s0376030800013598","title":"A Novel Scanning X-Ray Diffracto-Microscope/X-Ray Powder Diffractometer using Converged X-Ray Beam","abstract":"<jats:title>Abstract</jats:title><jats:p>A new type of scanning X-ray diffracto-microscope (SXDM) / X-ray powder diffractometer (XPD) which uses a converged incident beam, was designed, manufactured, and some of its basic characteristics were examined. The optical system consists of asymmetric reflection type curved crystal monochromators for both incident and reflection beams, a detector (FSPC, X-ray film, IP, nuclear plate), a translation mechanism for the specimen and also for the detector.</jats:p>","journal":"Advances in X-ray Analysis","year":1991,"id":28613,"datarank":0.0,"base_score":0.0,"endowment":0.0,"self_citation_contribution":0.0,"citation_network_contribution":0.0,"self_endowment_contribution":0.0,"citer_contribution":0.0,"corpus_percentile":null,"corpus_rank":null,"citation_count":0,"citer_count":0,"citers_with_citation_signal":0,"citers_with_endowment":0,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_data_producer":false,"deposit_databanks":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"fair_score":null,"fair_percentile":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":159804,"name":"Pujio P. Okamura","orcid":null,"position":1,"is_corresponding":false},{"id":159805,"name":"Hiroshi Biozaki","orcid":null,"position":2,"is_corresponding":false},{"id":159806,"name":"Yuji Kobayashi","orcid":null,"position":3,"is_corresponding":false},{"id":159807,"name":"Yoshiyuki Yamada","orcid":"0000-0002-3089-2332","position":4,"is_corresponding":false},{"id":159803,"name":"Ken Yukino","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"base_score":0.0,"endowment":0.0,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"24523987","pmcid":null,"openalex_id":"https://openalex.org/W2927095262","authors":[],"funders":[],"total_grants":0,"fwci":0.0,"citation_percentile":0.33087004,"influential_citations":0,"citation_trend":[],"oa_status":"closed","license":"https://www.cambridge.org/core/terms","oa_locations":[{"url":"https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S0376030800013598","host_type":"publisher"},{"url":"https://doi.org/10.1154/s0376030800013598","host_type":"journal"}],"fields_of_study":["X-ray Diffraction in Crystallography","Crystallography and Radiation Phenomena","Advanced X-ray Imaging Techniques","Materials Science","Physics"],"mesh_terms":[],"keywords":["Diffractometer","X-ray","Optics","Microscope","Reflection (computer programming)","Materials science","Detector","Beam (structure)","X-ray detector","Scanning electron microscope","Powder Diffractometer","Diffraction","Physics","Computer science"],"sdg_mappings":[],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-06-08T21:47:59.003744Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"fair_f":null,"fair_a":null,"fair_i":null,"fair_r":null,"fair_zscore":null,"fair_rationale":null,"fair_model":null,"fair_agent_version":null,"fair_fulltext_source":null,"fair_has_llm":null,"fair_computed_at":null,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}