{"doi":"10.1143/jjap.37.2734","title":"Where Are the X-Ray Event Grades Formed Inside the Pixel of the Charge-Coupled Device?  The Behavior of the Primary Charge Cloud Inside the Charge-Coupled Device","abstract":null,"journal":"Japanese Journal of Applied Physics","year":1998,"id":675864,"datarank":1.306162530295234,"base_score":3.4339872044851463,"endowment":3.4339872044851463,"self_citation_contribution":0.515098080672772,"citation_network_contribution":0.791064449622462,"self_endowment_contribution":0.515098080672772,"citer_contribution":0.791064449622462,"corpus_percentile":null,"corpus_rank":null,"citation_count":30,"citer_count":10,"citers_with_citation_signal":10,"citers_with_endowment":10,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_data_producer":false,"deposit_databanks":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"fair_score":null,"fair_percentile":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":1765947,"name":"Junko Hiraga Junko Hiraga","orcid":null,"position":1,"is_corresponding":false},{"id":1765949,"name":"Kumi Yoshita Kumi Yoshita","orcid":null,"position":2,"is_corresponding":false},{"id":1765951,"name":"andShunji Kitamoto andShunji Kitamoto","orcid":null,"position":3,"is_corresponding":false},{"id":1765945,"name":"Hiroshi Tsunemi Hiroshi Tsunemi","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"resolved":true,"title":"Where Are the X-Ray Event Grades Formed Inside the Pixel of the Charge-Coupled Device?  The Behavior of the Primary Charge Cloud Inside the Charge-Coupled Device","abstract":null,"is_dataset_classified":null,"base_score":3.4339872044851463,"endowment":3.4339872044851463,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"26207759","pmcid":null,"openalex_id":"https://openalex.org/W2005630603","authors":[],"funders":[],"total_grants":0,"fwci":5.8102,"citation_percentile":0.96551581,"influential_citations":0,"citation_trend":[{"year":2017,"count":2},{"year":2018,"count":1},{"year":2019,"count":1}],"oa_status":"bronze","license":"https://iopscience.iop.org/info/page/text-and-data-mining","oa_locations":[{"url":"https://iopscience.iop.org/article/10.1143/JJAP.37.2734/pdf","host_type":"journal"},{"url":"https://iopscience.iop.org/article/10.1143/JJAP.37.2734/pdf","host_type":"publisher"},{"url":"https://iopscience.iop.org/article/10.1143/JJAP.37.2734","host_type":"publisher"},{"url":"https://doi.org/10.1143/jjap.37.2734","host_type":"journal"}],"fields_of_study":["Advanced X-ray and CT Imaging","CCD and CMOS Imaging Sensors","Advanced Semiconductor Detectors and Materials"],"mesh_terms":[],"keywords":["Charge (physics)","Charge-coupled device","Pixel","Event (particle physics)","Materials science","CHARGE syndrome","Optoelectronics","Cloud computing","Physics","Optics","Astrophysics","Computer science","Psychology","Quantum mechanics","Operating system"],"sdg_mappings":[],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-08-17T01:48:17.070005Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"fair_f":null,"fair_a":null,"fair_i":null,"fair_r":null,"fair_zscore":null,"fair_rationale":null,"fair_model":null,"fair_agent_version":null,"fair_fulltext_source":null,"fair_has_llm":null,"fair_computed_at":null,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}