{"doi":"10.1143/jjap.34.2022","title":"New Tilting Mechanism of Electron Gun   for Reflection High-Energy Electron Diffraction","abstract":"<jats:p> \n    A new type of mechanism for tilting a reflection high-energy electron diffraction (RHEED) gun has been designed and constructed, which enables us to change the glancing angle of the primary electron beam when the specimen surface is located not only at a fixed position but also is moved to other positions.  This is an advantage when other measurements are simultaneously undertaken with RHEED. RHEED measurements of a Si(110) surface were performed by placing the Si(110) surface at different positions, and the ability was verified.  \n   </jats:p>","journal":"Japanese Journal of Applied Physics","year":1995,"id":20280,"datarank":0.0,"base_score":0.0,"endowment":0.0,"self_citation_contribution":0.0,"citation_network_contribution":0.0,"self_endowment_contribution":0.0,"citer_contribution":0.0,"corpus_percentile":null,"corpus_rank":null,"citation_count":0,"citer_count":0,"citers_with_citation_signal":0,"citers_with_endowment":0,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_data_producer":false,"deposit_databanks":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"fair_score":null,"fair_percentile":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":134618,"name":"Hisashi Oyama Hisashi Oyama","orcid":null,"position":1,"is_corresponding":false},{"id":134617,"name":"Toshihiro Ichikawa Toshihiro Ichikawa","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"base_score":0.0,"endowment":0.0,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"21071399","pmcid":null,"openalex_id":"https://openalex.org/W2062436698","authors":[],"funders":[],"total_grants":0,"fwci":0.0,"citation_percentile":0.17178276,"influential_citations":0,"citation_trend":[],"oa_status":"closed","license":"https://iopscience.iop.org/info/page/text-and-data-mining","oa_locations":[{"url":"https://iopscience.iop.org/article/10.1143/JJAP.34.2022","host_type":"publisher"},{"url":"https://iopscience.iop.org/article/10.1143/JJAP.34.2022/pdf","host_type":"publisher"},{"url":"https://doi.org/10.1143/jjap.34.2022","host_type":"journal"}],"fields_of_study":["Electron and X-Ray Spectroscopy Techniques","Advanced Electron Microscopy Techniques and Applications","Crystallography and Radiation Phenomena","Physics","Engineering"],"mesh_terms":[],"keywords":["Reflection high-energy electron diffraction","Electron diffraction","Reflection (computer programming)","Electron","Electron gun","Diffraction","Optics","Kikuchi line","Surface (topology)","Cathode ray","Atomic physics","Materials science","Physics","Geometry","Nuclear physics"],"sdg_mappings":[{"sdg_number":0,"sdg_label":"Affordable and clean energy"}],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-06-04T08:08:52.182187Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"fair_f":null,"fair_a":null,"fair_i":null,"fair_r":null,"fair_zscore":null,"fair_rationale":null,"fair_model":null,"fair_agent_version":null,"fair_fulltext_source":null,"fair_has_llm":null,"fair_computed_at":null,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}