{"doi":"10.1143/jjap.26.1394","title":"Multiple Slit Lens for Focusing-Deflection of Charged Particles","abstract":"<jats:p> \n The focusing-deflection lens action of a five-slit lens was examined. When the first three pairs and the remaining three pairs of electrodes with central pairs in common were operated as focusing-deflection and focusing lenses, respectively, an incident charged beam could be deflected in good focused condition. \n </jats:p>","journal":"Japanese Journal of Applied Physics","year":1987,"id":631319,"datarank":0.31191623125197543,"base_score":2.0794415416798357,"endowment":2.0794415416798357,"self_citation_contribution":0.31191623125197543,"citation_network_contribution":0.0,"self_endowment_contribution":0.31191623125197543,"citer_contribution":0.0,"corpus_percentile":null,"corpus_rank":null,"citation_count":7,"citer_count":0,"citers_with_citation_signal":0,"citers_with_endowment":0,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_data_producer":false,"deposit_databanks":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"fair_score":null,"fair_percentile":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":1636015,"name":"Harumitsu Yokota","orcid":null,"position":1,"is_corresponding":false},{"id":1636017,"name":"Katsuo Katayama","orcid":null,"position":2,"is_corresponding":false},{"id":1636014,"name":"Tohru Kishi","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"resolved":true,"title":"Multiple Slit Lens for Focusing-Deflection of Charged Particles","abstract":"<jats:p> \n The focusing-deflection lens action of a five-slit lens was examined. When the first three pairs and the remaining three pairs of electrodes with central pairs in common were operated as focusing-deflection and focusing lenses, respectively, an incident charged beam could be deflected in good focused condition. \n </jats:p>","is_dataset_classified":null,"base_score":2.0794415416798357,"endowment":2.0794415416798357,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"19767382","pmcid":null,"openalex_id":"https://openalex.org/W2037563592","authors":[],"funders":[],"total_grants":0,"fwci":1.1661,"citation_percentile":0.7568306,"influential_citations":0,"citation_trend":[{"year":2017,"count":1}],"oa_status":"closed","license":"https://iopscience.iop.org/info/page/text-and-data-mining","oa_locations":[{"url":"https://iopscience.iop.org/article/10.1143/JJAP.26.1394","host_type":"publisher"},{"url":"https://iopscience.iop.org/article/10.1143/JJAP.26.1394/pdf","host_type":"publisher"},{"url":"https://doi.org/10.1143/jjap.26.1394","host_type":"journal"}],"fields_of_study":["Electron and X-Ray Spectroscopy Techniques","Advanced Electron Microscopy Techniques and Applications","Non-Destructive Testing Techniques"],"mesh_terms":[],"keywords":["Deflection (physics)","Slit","Optics","Lens (geology)","Deflection angle","Electrostatic lens","Physics","Charged particle","Electrode","Beam (structure)","Materials science","Ion"],"sdg_mappings":[{"sdg_number":0,"sdg_label":"Affordable and clean energy"}],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-08-05T23:19:46.608472Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"fair_f":null,"fair_a":null,"fair_i":null,"fair_r":null,"fair_zscore":null,"fair_rationale":null,"fair_model":null,"fair_agent_version":null,"fair_fulltext_source":null,"fair_has_llm":null,"fair_computed_at":null,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}