{"doi":"10.1143/jjap.22.176","title":"Many-Beam Calculation of Reflection High Energy Electron Diffraction (RHEED) Intensities by the Multi-Slice Method","abstract":"<jats:p> \n In order to calculate RHEED intensities by using the dynamic electron diffraction theory, crystals are sliced in thin stabs parallel to the surface. The crystal potential in each stab is taken as constant the normal to the surface. The RHEED intensities are calculated from the products of matrices obtained from Bethe's dynamic diffraction theory for each slab. \n </jats:p>","journal":"Japanese Journal of Applied Physics","year":1983,"id":18723,"datarank":20.2107500552221,"base_score":5.631211781821365,"endowment":5.631211781821365,"self_citation_contribution":0.844681767273205,"citation_network_contribution":19.366068287948895,"self_endowment_contribution":0.844681767273205,"citer_contribution":19.366068287948895,"corpus_percentile":null,"corpus_rank":null,"citation_count":278,"citer_count":200,"citers_with_citation_signal":200,"citers_with_endowment":200,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":129142,"name":"Ayahiko Ichimiya","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"base_score":5.631211781821365,"endowment":5.631211781821365,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"21071399","pmcid":null,"openalex_id":"https://openalex.org/W2043464588","authors":[],"funders":[],"total_grants":0,"fwci":2.1524,"citation_percentile":0.87630541,"influential_citations":1,"citation_trend":[{"year":2012,"count":6},{"year":2013,"count":6},{"year":2014,"count":4},{"year":2015,"count":3},{"year":2016,"count":6},{"year":2017,"count":2},{"year":2018,"count":7},{"year":2019,"count":2},{"year":2020,"count":2},{"year":2021,"count":2},{"year":2022,"count":3},{"year":2023,"count":5},{"year":2024,"count":1},{"year":2025,"count":2}],"oa_status":"closed","license":"https://iopscience.iop.org/info/page/text-and-data-mining","oa_locations":[{"url":"https://iopscience.iop.org/article/10.1143/JJAP.22.176","host_type":"publisher"},{"url":"https://iopscience.iop.org/article/10.1143/JJAP.22.176/pdf","host_type":"publisher"},{"url":"https://doi.org/10.1143/jjap.22.176","host_type":"journal"}],"fields_of_study":["Crystallography and Radiation Phenomena","Microstructure and mechanical properties","Advanced Electron Microscopy Techniques and Applications","Physics"],"mesh_terms":[],"keywords":["Reflection high-energy electron diffraction","Electron diffraction","Gas electron diffraction","Diffraction","Reflection (computer programming)","Electron","Slab","Crystal (programming language)","Chemistry","Diffraction topography","Optics","Atomic physics","Materials science","Physics","X-ray crystallography","Quantum mechanics"],"sdg_mappings":[{"sdg_number":0,"sdg_label":"Affordable and clean energy"}],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-06-03T23:17:19.166269Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}