{"doi":"10.1109/mspec.1985.6370726","title":"Tools for probing `atomic' action [electron microscopes]","abstract":null,"journal":"IEEE Spectrum","year":1985,"id":22331,"datarank":0.10397207708399181,"base_score":0.6931471805599453,"endowment":0.6931471805599453,"self_citation_contribution":0.10397207708399181,"citation_network_contribution":0.0,"self_endowment_contribution":0.10397207708399181,"citer_contribution":0.0,"corpus_percentile":null,"corpus_rank":null,"citation_count":1,"citer_count":0,"citers_with_citation_signal":0,"citers_with_endowment":0,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_data_producer":false,"deposit_databanks":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"fair_score":null,"fair_percentile":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":140747,"name":"J.M. Gibson","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"base_score":0.6931471805599453,"endowment":0.6931471805599453,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"21071399","pmcid":null,"openalex_id":"https://openalex.org/W2490129862","authors":[],"funders":[],"total_grants":0,"fwci":0.3284,"citation_percentile":0.60571924,"influential_citations":0,"citation_trend":[],"oa_status":"closed","license":"https://doi.org/10.15223/policy-029","oa_locations":[{"url":"http://xplorestaging.ieee.org/ielx5/6/6370711/06370726.pdf?arnumber=6370726","host_type":"publisher"},{"url":"https://doi.org/10.1109/mspec.1985.6370726","host_type":"journal"}],"fields_of_study":["Electron and X-Ray Spectroscopy Techniques","Surface and Thin Film Phenomena","Advanced Materials Characterization Techniques","Materials Science","Engineering","Physics"],"mesh_terms":[],"keywords":["Microscope","Conventional transmission electron microscope","Low-voltage electron microscope","Electron beam-induced deposition","Microelectronics","Scanning transmission electron microscopy","Materials science","Electron microscope","Scanning tunneling microscope","Optics","Field ion microscope","Scanning Hall probe microscope","Transmission electron microscopy","Scanning electron microscope","Nanotechnology","Electron tomography","Optoelectronics","Ion","Chemistry","Physics"],"sdg_mappings":[{"sdg_number":0,"sdg_label":"Affordable and clean energy"}],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-06-06T19:27:15.354230Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"fair_f":null,"fair_a":null,"fair_i":null,"fair_r":null,"fair_zscore":null,"fair_rationale":null,"fair_model":null,"fair_agent_version":null,"fair_fulltext_source":null,"fair_has_llm":null,"fair_computed_at":null,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}