{"doi":"10.1107/s0108767386098756","title":"Dynamical diffraction calculations for RHEED and REM","abstract":null,"journal":"Acta Crystallographica Section A Foundations of Crystallography","year":1986,"id":31951,"datarank":6.010076356135863,"base_score":4.812184355372417,"endowment":4.812184355372417,"self_citation_contribution":0.7218276533058626,"citation_network_contribution":5.28824870283,"self_endowment_contribution":0.7218276533058626,"citer_contribution":5.28824870283,"corpus_percentile":null,"corpus_rank":null,"citation_count":122,"citer_count":89,"citers_with_citation_signal":74,"citers_with_endowment":74,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":169842,"name":"J. M. Cowley","orcid":null,"position":1,"is_corresponding":false},{"id":170167,"name":"L. m. Peng","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"base_score":4.812184355372417,"endowment":4.812184355372417,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"18998881","pmcid":null,"openalex_id":"https://openalex.org/W2080109662","authors":[],"funders":[{"funder_name":"National Science Foundation","grant_id":"8510059","title":"Disorder and Defects of Crystals Studied by Electron Microscopy (STEM and TEM) (Materials Research)"}],"total_grants":1,"fwci":14.2363,"citation_percentile":0.99699571,"influential_citations":0,"citation_trend":[{"year":2013,"count":1},{"year":2015,"count":2},{"year":2016,"count":1},{"year":2018,"count":1},{"year":2025,"count":1}],"oa_status":"closed","license":"IUCr Copyright and Licensing Policy","oa_locations":[{"url":"http://journals.iucr.org/a/issues/1986/06/00/a25436/a25436.pdf","host_type":"publisher"},{"url":"https://doi.org/10.1107/s0108767386098756","host_type":"journal"},{"url":"https://doi.org/10.1107/s0108767387078796","host_type":""},{"url":"http://journals.iucr.org/a/issues/1987/a1/00/a44471/a44471.pdf","host_type":""},{"url":"https://dx.doi.org/10.1107/s0108767386098756","host_type":""}],"fields_of_study":["Electron and X-Ray Spectroscopy Techniques","Surface and Thin Film Phenomena","Advanced Electron Microscopy Techniques and Applications","Physics","0103 physical sciences","02 engineering and technology","0210 nano-technology","01 natural sciences"],"mesh_terms":[],"keywords":["Reflection high-energy electron diffraction","Electron diffraction","Diffraction","Crystal (programming language)","Diffraction topography","Gas electron diffraction","Electron","Reflection (computer programming)","Chemistry","Bragg's law","Atomic physics","Molecular physics","Optics","Materials science","Physics","Quantum mechanics"],"sdg_mappings":[],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-06-09T09:22:53.349260Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}