{"doi":"10.1103/physrevlett.56.930","title":"Atomic Force Microscope","abstract":"The scanning tunneling microscope is proposed as a method to measure forces as small as 10−18 N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30 ÅA and a vertical resolution less than 1 Å.","journal":"Physical Review Letters","year":1986,"id":4869,"datarank":33.32689659559537,"base_score":9.574358290170174,"endowment":9.574358290170174,"self_citation_contribution":1.4361537435255263,"citation_network_contribution":31.890742852069845,"self_endowment_contribution":1.4361537435255263,"citer_contribution":31.890742852069845,"corpus_percentile":99.5,"corpus_rank":542,"citation_count":14390,"citer_count":194,"citers_with_citation_signal":194,"citers_with_endowment":194,"datacite_reuse_total":0,"is_dataset":false,"is_oa":true,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":"1986-03-03","authors":[{"id":50554,"name":"C. F. Quate","orcid":null,"position":1,"is_corresponding":false},{"id":50555,"name":"Ch. Gerber","orcid":null,"position":2,"is_corresponding":false},{"id":50553,"name":"G. Binnig","orcid":null,"position":0,"is_corresponding":true}],"reference_count":20,"raw_metadata":{"citation_network_status":"fetched"},"created_at":"2026-03-01T18:20:47.508186Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}