{"doi":"10.1063/1.5113049","title":"A scanning hall probe microscope for characterization of micro-magnets and mm-sized magnetic structures","abstract":null,"journal":"AIP Conference Proceedings","year":2019,"id":27779,"datarank":0.0,"base_score":0.0,"endowment":0.0,"self_citation_contribution":0.0,"citation_network_contribution":0.0,"self_endowment_contribution":0.0,"citer_contribution":0.0,"corpus_percentile":null,"corpus_rank":null,"citation_count":0,"citer_count":0,"citers_with_citation_signal":0,"citers_with_endowment":0,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_data_producer":false,"deposit_databanks":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"fair_score":null,"fair_percentile":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":157367,"name":"Roman B. G. Kramer","orcid":null,"position":1,"is_corresponding":false},{"id":157368,"name":"Nora. M. Dempsey","orcid":null,"position":2,"is_corresponding":false},{"id":157369,"name":"Klaus Hasselbach","orcid":null,"position":3,"is_corresponding":false},{"id":157366,"name":"Gorky Shaw","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"base_score":0.0,"endowment":0.0,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"24523987","pmcid":null,"openalex_id":"https://openalex.org/W2959283038","authors":[],"funders":[],"total_grants":0,"fwci":0.0,"citation_percentile":0.08706464,"influential_citations":0,"citation_trend":[],"oa_status":"green","license":"other-oa","oa_locations":[{"url":"https://hal.science/hal-02414116","host_type":"repository"},{"url":"https://hal.science/hal-02414116/file/030210_1_online.pdf","host_type":"GREEN"},{"url":"https://hal.science/hal-02414116","host_type":"repository"},{"url":"http://aip.scitation.org/doi/pdf/10.1063/1.5113049","host_type":"publisher"},{"url":"https://doi.org/10.1063/1.5113049","host_type":"journal"}],"fields_of_study":["Force Microscopy Techniques and Applications","Magnetic Field Sensors Techniques","Magnetic properties of thin films","Materials Science","Physics","Engineering"],"mesh_terms":[],"keywords":["Scanning Hall probe microscope","Magnetic force microscope","Microscope","Hall effect sensor","Materials science","Scanning probe microscopy","Magnet","Tuning fork","Scanning electron microscope","Stepper","Characterization (materials science)","Optics","Nanotechnology","Magnetic field","Conventional transmission electron microscope","Physics","Electrical engineering","Acoustics","Magnetization","Scanning transmission electron microscopy","Engineering"],"sdg_mappings":[],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-06-08T19:24:24.819572Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"fair_f":null,"fair_a":null,"fair_i":null,"fair_r":null,"fair_zscore":null,"fair_rationale":null,"fair_model":null,"fair_agent_version":null,"fair_fulltext_source":null,"fair_has_llm":null,"fair_computed_at":null,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}