{"doi":"10.1063/1.353949","title":"X-ray diffraction of nonuniform Ge<i>x</i>Si1−<i>x</i>/Si strained-layer superlattices","abstract":"<jats:p>GexSi1−x/Si strained-layer superlattices have been studied by means of double-crystal x-ray rocking curves. Double peaks in the same order superlattice reflections or strong oscillation fringes near the superlattice peaks were observed in the rocking curves for two different samples. Good agreement between theoretical simulations and their experimental counterparts were obtained. Our results demonstrate that these phenomena are attributed to serious local variation in layer thickness and composition.</jats:p>","journal":"Journal of Applied Physics","year":1993,"id":31847,"datarank":0.13809452144804374,"base_score":0.6931471805599453,"endowment":0.6931471805599453,"self_citation_contribution":0.10397207708399181,"citation_network_contribution":0.03412244436405194,"self_endowment_contribution":0.10397207708399181,"citer_contribution":0.03412244436405194,"corpus_percentile":null,"corpus_rank":null,"citation_count":1,"citer_count":1,"citers_with_citation_signal":1,"citers_with_endowment":1,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_data_producer":false,"deposit_databanks":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"fair_score":null,"fair_percentile":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":169810,"name":"Z. H. Mai","orcid":null,"position":1,"is_corresponding":false},{"id":169812,"name":"S. F. Cui","orcid":null,"position":2,"is_corresponding":false},{"id":169809,"name":"J. H. Li","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"base_score":0.6931471805599453,"endowment":0.6931471805599453,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"24523987","pmcid":null,"openalex_id":"https://openalex.org/W2082630578","authors":[],"funders":[],"total_grants":0,"fwci":0.0,"citation_percentile":0.17431275,"influential_citations":0,"citation_trend":[{"year":2012,"count":1}],"oa_status":"closed","license":null,"oa_locations":[{"url":"https://pubs.aip.org/aip/jap/article-pdf/73/11/7955/18661489/7955_1_online.pdf","host_type":"publisher"},{"url":"https://doi.org/10.1063/1.353949","host_type":"journal"}],"fields_of_study":["Semiconductor materials and interfaces","Semiconductor materials and devices","Silicon Nanostructures and Photoluminescence","Physics"],"mesh_terms":[],"keywords":["Superlattice","X-ray crystallography","Diffraction","Condensed matter physics","Materials science","Oscillation (cell signaling)","X-ray","Layer (electronics)","Crystal (programming language)","Silicon","Crystallography","Optics","Chemistry","Optoelectronics","Physics","Nanotechnology"],"sdg_mappings":[],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-06-09T08:54:40.440727Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"fair_f":null,"fair_a":null,"fair_i":null,"fair_r":null,"fair_zscore":null,"fair_rationale":null,"fair_model":null,"fair_agent_version":null,"fair_fulltext_source":null,"fair_has_llm":null,"fair_computed_at":null,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}