{"doi":"10.1063/1.1698330","title":"Aberration Correction with Electron Mirrors","abstract":"<jats:p>Both the spherical and the chromatic aberration of electron microscope objectives may, in principle, be corrected with the aid of a uniform retarding field acting as a mirror. Such an arrangement has the drawback of requiring a conducting film in the ray path and the insertion of the specimen in a region of high field strength. The employment of concave electron mirrors with concentrated field distribution, forming a real image of approximately unity magnification, is free from this drawback. The formulas for spherical and chromatic aberration, presented in a form suitable for calculation, are applied to a characteristic electron mirror field of this type (Φ = C+tanh(sinhz)). It is found that the aberration coefficients of the mirror are so large, however, that this method of aberration correction encounters serious practical difficulties.</jats:p>","journal":"Journal of Applied Physics","year":1949,"id":21911,"datarank":5.802298168890387,"base_score":3.5553480614894135,"endowment":3.5553480614894135,"self_citation_contribution":0.5333022092234121,"citation_network_contribution":5.2689959596669755,"self_endowment_contribution":0.5333022092234121,"citer_contribution":5.2689959596669755,"corpus_percentile":null,"corpus_rank":null,"citation_count":34,"citer_count":34,"citers_with_citation_signal":29,"citers_with_endowment":29,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":136825,"name":"E. G. Ramberg","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"base_score":3.5553480614894135,"endowment":3.5553480614894135,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"24259432","pmcid":null,"openalex_id":"https://openalex.org/W1991421368","authors":[],"funders":[],"total_grants":0,"fwci":3.0786,"citation_percentile":0.88927336,"influential_citations":2,"citation_trend":[{"year":2014,"count":2},{"year":2018,"count":1},{"year":2019,"count":3},{"year":2020,"count":1},{"year":2024,"count":2}],"oa_status":"closed","license":null,"oa_locations":[{"url":"https://pubs.aip.org/aip/jap/article-pdf/20/2/183/18308312/183_1_online.pdf","host_type":"publisher"},{"url":"https://doi.org/10.1063/1.1698330","host_type":"journal"}],"fields_of_study":["Electron and X-Ray Spectroscopy Techniques","Advancements in Photolithography Techniques","Advanced Electron Microscopy Techniques and Applications","Physics"],"mesh_terms":[],"keywords":["Spherical aberration","Chromatic aberration","Contrast transfer function","Optics","Magnification","Optical aberration","Electron optics","Physics","Field (mathematics)","Electron microscope","Curved mirror","Electron","Chromatic scale","Optical path","Mathematics","Lens (geology)","Wavefront"],"sdg_mappings":[{"sdg_number":0,"sdg_label":"Decent work and economic growth"}],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-06-06T17:14:00.382728Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}