{"doi":"10.1063/1.1684266","title":"Secondary Electron Detection in a Field Emission Scanning Microscope","abstract":"<jats:p>Operation of a field emission scanning microscope in a secondary electron mode is described. The microscope uses only a field emission electron gun without auxiliary lenses and a silicon surface barrier detector to detect the secondary electron current. Resolution of 100 to 200 Å with beam currents of 10−11 to 10−10 A is reported. Micrographs of a variety of specimens are shown.</jats:p>","journal":"Review of Scientific Instruments","year":1970,"id":21074,"datarank":1.2838583031135928,"base_score":2.9444389791664403,"endowment":2.9444389791664403,"self_citation_contribution":0.44166584687496613,"citation_network_contribution":0.8421924562386268,"self_endowment_contribution":0.44166584687496613,"citer_contribution":0.8421924562386268,"corpus_percentile":null,"corpus_rank":null,"citation_count":18,"citer_count":14,"citers_with_citation_signal":10,"citers_with_endowment":10,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_data_producer":false,"deposit_databanks":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"fair_score":null,"fair_percentile":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":137064,"name":"M. Isaacson","orcid":null,"position":1,"is_corresponding":false},{"id":33386,"name":"D. Johnson","orcid":null,"position":2,"is_corresponding":false},{"id":137063,"name":"A. V. Crewe","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"base_score":2.9444389791664403,"endowment":2.9444389791664403,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"24259432","pmcid":null,"openalex_id":"https://openalex.org/W2037618439","authors":[],"funders":[],"total_grants":0,"fwci":1.153,"citation_percentile":0.76774194,"influential_citations":0,"citation_trend":[{"year":2019,"count":1}],"oa_status":"closed","license":null,"oa_locations":[{"url":"https://pubs.aip.org/aip/rsi/article-pdf/41/1/20/19263716/20_1_online.pdf","host_type":"publisher"},{"url":"https://doi.org/10.1063/1.1684266","host_type":"journal"}],"fields_of_study":["Electron and X-Ray Spectroscopy Techniques","Surface and Thin Film Phenomena","Advanced Electron Microscopy Techniques and Applications","Physics"],"mesh_terms":[],"keywords":["Field electron emission","Scanning electron microscope","Electron beam-induced deposition","Conventional transmission electron microscope","Environmental scanning electron microscope","Materials science","Field emission gun","Secondary electrons","Low-voltage electron microscope","Optics","Electron microscope","Microscope","Electron","Secondary emission","Field emission microscopy","Scanning confocal electron microscopy","Detector","Resolution (logic)","Silicon","Scanning transmission electron microscopy","Optoelectronics","Physics","Diffraction","Computer science"],"sdg_mappings":[{"sdg_number":0,"sdg_label":"Affordable and clean energy"}],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-06-06T14:24:17.507368Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"fair_f":null,"fair_a":null,"fair_i":null,"fair_r":null,"fair_zscore":null,"fair_rationale":null,"fair_model":null,"fair_agent_version":null,"fair_fulltext_source":null,"fair_has_llm":null,"fair_computed_at":null,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}