{"doi":"10.1063/1.1683910","title":"A Simple Scanning Electron Microscope","abstract":"<jats:p>A simple scanning microscope has been built which uses a field emission electron gun alone, without the aid of auxiliary lenses. The design and operation of the microscope are described and the calculated performance is compared with experiment. Resolution of 100 Å has been obtained and is shown in transmission electron micrographs. The probe current is of the order of 10−10 to 10−11 A, a value which is high enough to allow micrographs to be taken with scan times of 10 sec.</jats:p>","journal":"Review of Scientific Instruments","year":1969,"id":22248,"datarank":13.121472329098712,"base_score":5.043425116919247,"endowment":5.043425116919247,"self_citation_contribution":0.7565137675378871,"citation_network_contribution":12.364958561560824,"self_endowment_contribution":0.7565137675378871,"citer_contribution":12.364958561560824,"corpus_percentile":null,"corpus_rank":null,"citation_count":154,"citer_count":130,"citers_with_citation_signal":99,"citers_with_endowment":99,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":137064,"name":"M. Isaacson","orcid":null,"position":1,"is_corresponding":false},{"id":33386,"name":"D. Johnson","orcid":null,"position":2,"is_corresponding":false},{"id":137063,"name":"A. V. Crewe","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"base_score":5.043425116919247,"endowment":5.043425116919247,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"21071399","pmcid":null,"openalex_id":"https://openalex.org/W2085521168","authors":[],"funders":[],"total_grants":0,"fwci":7.0795,"citation_percentile":0.9760479,"influential_citations":1,"citation_trend":[{"year":2012,"count":7},{"year":2013,"count":4},{"year":2014,"count":4},{"year":2015,"count":5},{"year":2016,"count":1},{"year":2017,"count":4},{"year":2018,"count":4},{"year":2019,"count":5},{"year":2020,"count":2},{"year":2021,"count":4},{"year":2022,"count":7},{"year":2023,"count":4},{"year":2024,"count":3},{"year":2025,"count":3},{"year":2026,"count":1}],"oa_status":"closed","license":null,"oa_locations":[{"url":"https://digital.library.unt.edu/ark:/67531/metadc1061663/m2/1/high_res_d/4820037.pdf","host_type":"GREEN"},{"url":"https://pubs.aip.org/aip/rsi/article-pdf/40/2/241/8357386/241_1_online.pdf","host_type":"publisher"},{"url":"https://doi.org/10.1063/1.1683910","host_type":"journal"},{"url":"https://escholarship.org/uc/item/71g2n1gp","host_type":"repository"}],"fields_of_study":["Electron and X-Ray Spectroscopy Techniques","Advanced Electron Microscopy Techniques and Applications","Force Microscopy Techniques and Applications","Materials Science","Physics","Engineering"],"mesh_terms":[],"keywords":["Micrograph","Field emission gun","Conventional transmission electron microscope","Low-voltage electron microscope","Microscope","Scanning transmission electron microscopy","Optics","Scanning electron microscope","Materials science","Environmental scanning electron microscope","Scanning Hall probe microscope","Electron microscope","Resolution (logic)","Field emission microscopy","Field electron emission","Electron","Physics","Diffraction","Computer science"],"sdg_mappings":[{"sdg_number":0,"sdg_label":"Affordable and clean energy"}],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-06-06T18:25:21.942558Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}