{"doi":"10.1063/1.1663200","title":"Composition determination of Al<i>x</i>Ga1−<i>x</i>P alloys using diffracted x-ray intensities","abstract":"<jats:p>It is fundamental and important to determine the composition of an alloy as the alloy is prepared. This study deals with a method of composition determination for the AlxGa1−xP ternary compound. The relative integrated intensity of a diffracted x ray as a function of composition is calculated for the AlxGa1−xP system. The intensities of reflections having indices whose sum is an odd multiple of 2 depend strongly on composition. This is ascribed to the fact that atomic scattering factors of Al and P are nearly equal and considerably smaller than that of Ga. The diffracted x-ray intensities for the AlxGa1−xP crystals are measured. The ratio I200/I111 decreases drastically with Al content and agrees closely with the calculated curve. It is concluded that the composition of the AlxGa1−xP alloy can be deduced simply from the diffracted x-ray intensity ratio.</jats:p>","journal":"Journal of Applied Physics","year":1974,"id":31833,"datarank":0.5430662790611068,"base_score":1.6094379124341003,"endowment":1.6094379124341003,"self_citation_contribution":0.24141568686511508,"citation_network_contribution":0.3016505921959918,"self_endowment_contribution":0.24141568686511508,"citer_contribution":0.3016505921959918,"corpus_percentile":null,"corpus_rank":null,"citation_count":4,"citer_count":4,"citers_with_citation_signal":2,"citers_with_endowment":2,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_data_producer":false,"deposit_databanks":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"fair_score":null,"fair_percentile":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":169779,"name":"T. Nanmori","orcid":null,"position":1,"is_corresponding":false},{"id":169784,"name":"S. Saito","orcid":null,"position":2,"is_corresponding":false},{"id":169787,"name":"T. Miyauchi","orcid":null,"position":3,"is_corresponding":false},{"id":169774,"name":"H. Sonomura","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"base_score":1.6094379124341003,"endowment":1.6094379124341003,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"24523987","pmcid":null,"openalex_id":"https://openalex.org/W2060328890","authors":[],"funders":[],"total_grants":0,"fwci":1.0012,"citation_percentile":0.76166583,"influential_citations":0,"citation_trend":[],"oa_status":"closed","license":null,"oa_locations":[{"url":"https://pubs.aip.org/aip/jap/article-pdf/45/11/5109/18368762/5109_1_online.pdf","host_type":"publisher"},{"url":"https://doi.org/10.1063/1.1663200","host_type":"journal"}],"fields_of_study":["Electron and X-Ray Spectroscopy Techniques","X-ray Spectroscopy and Fluorescence Analysis","X-ray Diffraction in Crystallography","Physics","Materials Science"],"mesh_terms":[],"keywords":["Diffraction","X-ray","Composition (language)","Alloy","X-ray crystallography","Intensity (physics)","Scattering","Ternary operation","Chemical composition","Ternary alloy","Analytical Chemistry (journal)","Crystallography","Materials science","Chemistry","Physics","Optics","Thermodynamics","Metallurgy"],"sdg_mappings":[],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-06-09T08:51:29.155518Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"fair_f":null,"fair_a":null,"fair_i":null,"fair_r":null,"fair_zscore":null,"fair_rationale":null,"fair_model":null,"fair_agent_version":null,"fair_fulltext_source":null,"fair_has_llm":null,"fair_computed_at":null,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}