{"doi":"10.1063/1.117524","title":"Critical thickness of GaN thin films on sapphire (0001)","abstract":"<jats:p>Synchrotron x-ray diffraction was employed to measure the lattice constants a and c of GaN films grown with an AlN buffer layer on sapphire (0001) over a thickness range of 50 Å to 1 μm. We used multiple reflections and a least-squares fit method for high reliability. As the thickness increased, the lattice constant a increased from 3.133 Å to 3.196 Å and c decreased from 5.226 Å to 5.183 Å. The expected trend was fitted to an equilibrium theory, allowing the critical thickness of GaN on AlN to be estimated at 29 Å ± 4 Å in good agreement with a theoretical prediction.</jats:p>","journal":"Applied Physics Letters","year":1996,"id":38458,"datarank":10.416667097064437,"base_score":4.6913478822291435,"endowment":4.6913478822291435,"self_citation_contribution":0.7037021823343717,"citation_network_contribution":9.712964914730065,"self_endowment_contribution":0.7037021823343717,"citer_contribution":9.712964914730065,"corpus_percentile":null,"corpus_rank":null,"citation_count":108,"citer_count":105,"citers_with_citation_signal":96,"citers_with_endowment":96,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"fair_score":null,"fair_percentile":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":190754,"name":"I. K. Robinson","orcid":null,"position":1,"is_corresponding":false},{"id":190755,"name":"Jaemin Myoung","orcid":null,"position":2,"is_corresponding":false},{"id":190756,"name":"Kyuhwan Shim","orcid":null,"position":3,"is_corresponding":false},{"id":190757,"name":"Myung-Cheol Yoo","orcid":null,"position":4,"is_corresponding":false},{"id":190758,"name":"Kyekyoon Kim","orcid":null,"position":5,"is_corresponding":false},{"id":190753,"name":"Chinkyo Kim","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"base_score":4.6913478822291435,"endowment":4.6913478822291435,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"18998881","pmcid":null,"openalex_id":"https://openalex.org/W2047140161","authors":[],"funders":[],"total_grants":0,"fwci":4.5255,"citation_percentile":0.95150241,"influential_citations":0,"citation_trend":[{"year":2012,"count":6},{"year":2013,"count":5},{"year":2014,"count":3},{"year":2015,"count":5},{"year":2016,"count":4},{"year":2017,"count":4},{"year":2018,"count":1},{"year":2019,"count":1},{"year":2020,"count":3},{"year":2022,"count":5},{"year":2023,"count":3},{"year":2024,"count":3},{"year":2025,"count":1}],"oa_status":"closed","license":null,"oa_locations":[{"url":"https://pubs.aip.org/aip/apl/article-pdf/69/16/2358/18522225/2358_1_online.pdf","host_type":"publisher"},{"url":"https://doi.org/10.1063/1.117524","host_type":"journal"}],"fields_of_study":["GaN-based semiconductor devices and materials","Semiconductor materials and devices","Optical Coatings and Gratings","Materials Science","Physics","Engineering"],"mesh_terms":[],"keywords":["Sapphire","Lattice constant","Materials science","Synchrotron","Diffraction","X-ray crystallography","Thin film","Wide-bandgap semiconductor","Lattice (music)","Condensed matter physics","Analytical Chemistry (journal)","Optics","Chemistry","Optoelectronics","Nanotechnology","Physics","Laser"],"sdg_mappings":[],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-06-11T03:33:59.948604Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"fair_f":null,"fair_a":null,"fair_i":null,"fair_r":null,"fair_zscore":null,"fair_rationale":null,"fair_model":null,"fair_agent_version":null,"fair_fulltext_source":null,"fair_has_llm":null,"fair_computed_at":null,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}