{"doi":"10.1063/1.1145143","title":"A combined scanning tunneling, scanning force, frictional force, and attractive force microscope","abstract":"<jats:p>We report on the adaptation of a commercially available scanning force microscope (SFM) for the simultaneous measurement of electrical and mechanical surface properties combining the scanning tunneling microscope, the SFM, and the friction force microscope. Furthermore, the microscope may be operated in the noncontact or attractive mode (AC-SFM) which is specially suited for the nondestructive investigation of soft sample surfaces.</jats:p>","journal":"Review of Scientific Instruments","year":1994,"id":29825,"datarank":0.6942880597222391,"base_score":2.302585092994046,"endowment":2.302585092994046,"self_citation_contribution":0.3453877639491069,"citation_network_contribution":0.34890029577313214,"self_endowment_contribution":0.3453877639491069,"citer_contribution":0.34890029577313214,"corpus_percentile":null,"corpus_rank":null,"citation_count":9,"citer_count":6,"citers_with_citation_signal":6,"citers_with_endowment":6,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_data_producer":false,"deposit_databanks":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"fair_score":null,"fair_percentile":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":163518,"name":"K. D. Jandt","orcid":null,"position":1,"is_corresponding":false},{"id":163519,"name":"D. Descouts","orcid":null,"position":2,"is_corresponding":false},{"id":163517,"name":"L. M. Eng","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"base_score":2.302585092994046,"endowment":2.302585092994046,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"24523987","pmcid":null,"openalex_id":"https://openalex.org/W2079594750","authors":[],"funders":[],"total_grants":0,"fwci":2.0413,"citation_percentile":0.85836218,"influential_citations":0,"citation_trend":[],"oa_status":"closed","license":null,"oa_locations":[{"url":"https://pubs.aip.org/aip/rsi/article-pdf/65/2/390/8387898/390_1_online.pdf","host_type":"BRONZE"},{"url":"https://pubs.aip.org/aip/rsi/article-pdf/65/2/390/19228646/390_1_online.pdf","host_type":"publisher"},{"url":"https://doi.org/10.1063/1.1145143","host_type":"journal"}],"fields_of_study":["Force Microscopy Techniques and Applications","Mechanical and Optical Resonators","Near-Field Optical Microscopy","Materials Science","Physics","Engineering"],"mesh_terms":[],"keywords":["Microscope","Scanning probe microscopy","Materials science","Scanning Hall probe microscope","Scanning tunneling microscope","Scanning Force Microscopy","Magnetic force microscope","Conductive atomic force microscopy","Scanning acoustic microscope","Scanning ion-conductance microscopy","Atomic force acoustic microscopy","Non-contact atomic force microscopy","Microscopy","Scanning electron microscope","Atomic force microscopy","Optics","Nanotechnology","Conventional transmission electron microscope","Scanning confocal electron microscopy","Composite material","Acoustic microscopy","Physics","Scanning transmission electron microscopy"],"sdg_mappings":[],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-06-09T00:51:36.213016Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"fair_f":null,"fair_a":null,"fair_i":null,"fair_r":null,"fair_zscore":null,"fair_rationale":null,"fair_model":null,"fair_agent_version":null,"fair_fulltext_source":null,"fair_has_llm":null,"fair_computed_at":null,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}