{"doi":"10.1063/1.112259","title":"Multifunctional, micropipette based force cantilevers for scanned probe microscopy","abstract":"<jats:p>We demonstrate quartz micropipette and optical fiber based structures with unique applications for scanned probe microscopy. These probes are produced by drawing, cantilevering, and polishing tapered micropipettes and optical fibers and have significantly greater potential functionality than any other currently available scanning tip. We present normal force, contact mode imaging of a selection of surfaces, operating these probes with different commercial instruments for atomic force microscopy (AFM). With their very sharp tips, ultrahigh aspect ratios, and readily adjustable force constants and resonance frequencies, the probes present an attractive alternative to conventional microfabricated cantilevers that are currently in routine use with AFM. Bent quartz optical fiber probes also enable simple integration of near-field scanning optical microscopy and AFM.</jats:p>","journal":"Applied Physics Letters","year":1994,"id":690212,"datarank":4.391746882508049,"base_score":3.9889840465642745,"endowment":3.9889840465642745,"self_citation_contribution":0.5983476069846413,"citation_network_contribution":3.7933992755234076,"self_endowment_contribution":0.5983476069846413,"citer_contribution":3.7933992755234076,"corpus_percentile":null,"corpus_rank":null,"citation_count":53,"citer_count":41,"citers_with_citation_signal":32,"citers_with_endowment":32,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_data_producer":false,"deposit_databanks":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"fair_score":null,"fair_percentile":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":1134764,"name":"Aaron Lewis","orcid":null,"position":1,"is_corresponding":false},{"id":1803258,"name":"Galina Fish","orcid":null,"position":2,"is_corresponding":false},{"id":1803259,"name":"Shmuel Shalom","orcid":null,"position":3,"is_corresponding":false},{"id":1803260,"name":"Thomas M. Jovin","orcid":null,"position":4,"is_corresponding":false},{"id":1803261,"name":"Achim Schaper","orcid":null,"position":5,"is_corresponding":false},{"id":1803262,"name":"Sidney R. Cohen","orcid":null,"position":6,"is_corresponding":false},{"id":1803257,"name":"Klony Lieberman","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"resolved":true,"title":"Multifunctional, micropipette based force cantilevers for scanned probe microscopy","abstract":"<jats:p>We demonstrate quartz micropipette and optical fiber based structures with unique applications for scanned probe microscopy. These probes are produced by drawing, cantilevering, and polishing tapered micropipettes and optical fibers and have significantly greater potential functionality than any other currently available scanning tip. We present normal force, contact mode imaging of a selection of surfaces, operating these probes with different commercial instruments for atomic force microscopy (AFM). With their very sharp tips, ultrahigh aspect ratios, and readily adjustable force constants and resonance frequencies, the probes present an attractive alternative to conventional microfabricated cantilevers that are currently in routine use with AFM. Bent quartz optical fiber probes also enable simple integration of near-field scanning optical microscopy and AFM.</jats:p>","is_dataset_classified":null,"base_score":3.9889840465642745,"endowment":3.9889840465642745,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"21097893","pmcid":null,"openalex_id":"https://openalex.org/W2002315698","authors":[],"funders":[],"total_grants":0,"fwci":3.8291,"citation_percentile":0.92903314,"influential_citations":0,"citation_trend":[{"year":2012,"count":1},{"year":2013,"count":2},{"year":2014,"count":2},{"year":2015,"count":1},{"year":2021,"count":1},{"year":2022,"count":2},{"year":2023,"count":1}],"oa_status":"closed","license":null,"oa_locations":[{"url":"https://pubs.aip.org/aip/apl/article-pdf/65/5/648/7802232/648_1_online.pdf","host_type":"BRONZE"},{"url":"https://pubs.aip.org/aip/apl/article-pdf/65/5/648/18505981/648_1_online.pdf","host_type":"publisher"},{"url":"https://doi.org/10.1063/1.112259","host_type":"journal"}],"fields_of_study":["Near-Field Optical Microscopy","Force Microscopy Techniques and Applications","Integrated Circuits and Semiconductor Failure Analysis","Materials Science","Engineering","Physics"],"mesh_terms":[],"keywords":["Cantilever","Materials science","Atomic force acoustic microscopy","Non-contact atomic force microscopy","Microscopy","Pipette","Scanning ion-conductance microscopy","Scanning probe microscopy","Nanotechnology","Optical microscope","Optical fiber","Scanning capacitance microscopy","Atomic force microscopy","Polishing","Near-field scanning optical microscope","Vibrational analysis with scanning probe microscopy","Conductive atomic force microscopy","Optics","Optoelectronics","Magnetic force microscope","Scanning confocal electron microscopy","Chemistry","Scanning electron microscope","Composite material"],"sdg_mappings":[],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-08-23T05:42:07.805145Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"fair_f":null,"fair_a":null,"fair_i":null,"fair_r":null,"fair_zscore":null,"fair_rationale":null,"fair_model":null,"fair_agent_version":null,"fair_fulltext_source":null,"fair_has_llm":null,"fair_computed_at":null,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}