{"doi":"10.1016/j.coelec.2020.06.001","title":"Recent advances of scanning electrochemical microscopy and scanning ion conductance microscopy for single-cell analysis","abstract":null,"journal":"Current Opinion in Electrochemistry","year":2020,"id":662832,"datarank":0.6141516843333151,"base_score":4.0943445622221,"endowment":4.0943445622221,"self_citation_contribution":0.6141516843333151,"citation_network_contribution":0.0,"self_endowment_contribution":0.6141516843333151,"citer_contribution":0.0,"corpus_percentile":null,"corpus_rank":null,"citation_count":59,"citer_count":0,"citers_with_citation_signal":0,"citers_with_endowment":0,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_data_producer":false,"deposit_databanks":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"fair_score":null,"fair_percentile":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":704624,"name":"Tong Zhu","orcid":"0000-0002-0012-0091","position":1,"is_corresponding":false},{"id":1730464,"name":"Jinxin Lang","orcid":null,"position":2,"is_corresponding":false},{"id":1730465,"name":"Wenxuan Fu","orcid":null,"position":3,"is_corresponding":false},{"id":108153,"name":"Fei Li","orcid":"0000-0003-0720-3129","position":4,"is_corresponding":false},{"id":1059244,"name":"Junjie Zhang","orcid":"0000-0001-8809-1485","position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"resolved":true,"title":"Recent advances of scanning electrochemical microscopy and scanning ion conductance microscopy for single-cell analysis","abstract":null,"is_dataset_classified":null,"base_score":4.0943445622221,"endowment":4.0943445622221,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"19965766","pmcid":null,"openalex_id":"https://openalex.org/W3036968693","authors":[],"funders":[],"total_grants":0,"fwci":3.2462,"citation_percentile":0.94170596,"influential_citations":0,"citation_trend":[{"year":2020,"count":3},{"year":2021,"count":11},{"year":2022,"count":10},{"year":2023,"count":14},{"year":2024,"count":8},{"year":2025,"count":9},{"year":2026,"count":4}],"oa_status":"closed","license":"https://www.elsevier.com/legal/tdmrep-license","oa_locations":[{"url":"https://api.elsevier.com/content/article/PII:S2451910320301198?httpAccept=text/xml","host_type":"publisher"},{"url":"https://api.elsevier.com/content/article/PII:S2451910320301198?httpAccept=text/plain","host_type":"publisher"},{"url":"https://doi.org/10.1016/j.coelec.2020.06.001","host_type":"journal"}],"fields_of_study":["Electrochemical Analysis and Applications","Analytical Chemistry and Sensors","Force Microscopy Techniques and Applications"],"mesh_terms":[],"keywords":["Scanning ion-conductance microscopy","Scanning probe microscopy","Scanning electrochemical microscopy","Microscopy","Materials science","Nanotechnology","Characterization (materials science)","Scanning capacitance microscopy","Scanning electron microscope","Scanning confocal electron microscopy","Scanning thermal microscopy","Analytical Chemistry (journal)","Chemistry","Electrochemistry","Electrode","Atomic force microscopy","Optics","Physics","Composite material","Chromatography"],"sdg_mappings":[],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-08-12T17:41:42.577093Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"fair_f":null,"fair_a":null,"fair_i":null,"fair_r":null,"fair_zscore":null,"fair_rationale":null,"fair_model":null,"fair_agent_version":null,"fair_fulltext_source":null,"fair_has_llm":null,"fair_computed_at":null,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}