{"doi":"10.1002/crat.19790140815","title":"Measurement of Microcrystal Size by Means of Diffraction of X‐Rays","abstract":"<jats:title>Abstract</jats:title><jats:p>The diffraction function expressing the dependence of the intensity of the diffracted X‐rays on the angle of diffraction ϱ is derived. On the basis of this equation two methods of measuring the microcrystal size in the direction of the normal line onto the beam of coherently diffracting atom planes are elaborated. Further, the methods for measuring the diffraction line enlargement owing to the experimental conditions are given here.</jats:p>","journal":"Kristall und Technik","year":1979,"id":18103,"datarank":0.8025199510795535,"base_score":1.3862943611198906,"endowment":1.3862943611198906,"self_citation_contribution":0.20794415416798362,"citation_network_contribution":0.5945757969115699,"self_endowment_contribution":0.20794415416798362,"citer_contribution":0.5945757969115699,"corpus_percentile":null,"corpus_rank":null,"citation_count":3,"citer_count":2,"citers_with_citation_signal":2,"citers_with_endowment":2,"datacite_reuse_total":0,"is_dataset":false,"is_dataset_confidence":null,"is_data_producer":false,"deposit_databanks":null,"is_oa":false,"file_count":0,"downloads":0,"has_version_chain":false,"published_date":null,"fair_score":null,"fair_percentile":null,"algorithm_id":"datarank_citation_only_1hop_v6","ranking_scope":"data_only","authors":[{"id":127061,"name":"V. Pučálka","orcid":null,"position":0,"is_corresponding":false}],"reference_count":0,"raw_metadata":{"has_enrichment":true,"base_score":1.3862943611198906,"endowment":1.3862943611198906,"datacite_reuse_total":0,"file_count":0,"downloads":0,"views":0,"has_version_chain":false,"is_dataset":false,"is_oa":false,"pmid":"21071399","pmcid":null,"openalex_id":"https://openalex.org/W1983689417","authors":[],"funders":[],"total_grants":0,"fwci":0.9637,"citation_percentile":0.69561694,"influential_citations":0,"citation_trend":[],"oa_status":"closed","license":"http://onlinelibrary.wiley.com/termsAndConditions#vor","oa_locations":[{"url":"https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fcrat.19790140815","host_type":"publisher"},{"url":"https://onlinelibrary.wiley.com/doi/pdf/10.1002/crat.19790140815","host_type":"publisher"},{"url":"https://doi.org/10.1002/crat.19790140815","host_type":"journal"}],"fields_of_study":["X-ray Diffraction in Crystallography","Crystallography and Radiation Phenomena","Advanced X-ray Imaging Techniques","Chemistry"],"mesh_terms":[],"keywords":["Diffraction","X-ray crystallography","Optics","Line (geometry)","Intensity (physics)","Materials science","Physics","Geometry","Mathematics"],"sdg_mappings":[],"linked_datasets":[],"clinical_trials":[],"software_tools":[],"database_accessions":[],"source":"live","citation_network_status":"fetched"},"created_at":"2026-06-03T17:51:27.324648Z","pmid":null,"pmcid":null,"fwci":null,"citation_percentile":null,"influential_citations":0,"oa_status":null,"license":null,"views":0,"total_file_size_bytes":0,"version_count":0,"fair_f":null,"fair_a":null,"fair_i":null,"fair_r":null,"fair_zscore":null,"fair_rationale":null,"fair_model":null,"fair_agent_version":null,"fair_fulltext_source":null,"fair_has_llm":null,"fair_computed_at":null,"clinical_trials":[],"software_tools":[],"db_accessions":[],"linked_datasets":[],"topics":[]}