{"name":"Konstantina Vasilatou","orcid":"0000-0002-7771-9596","affiliation":"Swiss Federal Institute of Metrology","id":898331,"datarank":0.0,"percentile_rank":0.0,"paper_count":0,"h_index":null,"cited_by_count":null,"works_count":null,"i10_index":null,"openalex_id":null,"last_known_institutions":[],"top_fields":[]}